Influence of atomic oxygen exposure on surface resistivity of silicon doped polyimide affecting spacecraft charging

Author:

Mundari Noor Danish Ahrar,Srivastava A.K.,Toyoda Kazuhiro,Cho Mengu

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference15 articles.

1. Failure mechanism and protection method of spacecraft power system;Cho,2005

2. Investigating the power system failure of a LEO satellite;Maejima,2005

3. Accomplishment of multi-utility spacecraft charging analysis tool (MUSCAT) and its future evolution;Hatta;Acta Astronaut,2009

4. A survey of spacecraft charging events;Lai Shu,1998

5. A critical overview on spacecraft charging mitigation method;Lai Shu;IEEE Transac Plasma Sci,2003

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