〈0001〉-oriented growth of AlN films on Si(111) by microwave plasma CVD with AlBr3NH3N2 system
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference10 articles.
1. Intrinsic stress in A1N prepared by dual-ion-beam sputtering
2. Laser‐induced chemical vapor deposition of AlN films
3. The growth of single crystalline GaN on a Si substrate using AIN as an intermediate layer
4. Chemical Vapour Deposition and New Inorganic Materials;Meng,1984
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