Reliability estimations of components from masked system life data
Author:
Publisher
Elsevier BV
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Reference8 articles.
1. Maximum likelihood analysis of component reliability using masked system life-test data;Usher;IEEE Trans Reliab,1988
2. Analysis of incomplete data in competing risks model;Miyakawa;IEEE Trans Reliab,1984
3. Exact maximum likelihood estimation using masked system data;Lin;IEEE Trans Reliab,1993
4. Weibull component reliability-prediction in the presence of masked data;Usher;IEEE Trans Reliab,1996
5. Bayes estimation of component reliability from masked system-life data;Lin;IEEE Trans Reliab,1996
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