Optimal burn-in procedure for mixed populations based on the device degradation process history-Reference-Cited by-同舟云学术

Optimal burn-in procedure for mixed populations based on the device degradation process history

Published:2016-06 Issue:3 Volume:251 Page:988-998
ISSN:0377-2217
Container-title:European Journal of Operational Research
language:en
Short-container-title:European Journal of Operational Research

Author:

Cha Ji Hwan,Pulcini Gianpaolo

Funder

Ministry of Education, Science and Technology

Publisher

Elsevier BV

Subject

Information Systems and Management,Management Science and Operations Research,Modelling and Simulation,General Computer Science,Industrial and Manufacturing Engineering

Reference34 articles.

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3. On a better burn-in procedure;Cha;Journal of Applied Probability,2000

4. Burn-in procedures for a generalized model;Cha;Journal of Applied Probability,2001

5. Burn-in by environmental shocks for two ordered subpopulations;Cha;European Journal of Operational Research,2010

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