Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements

Author:

Spencer B.F.,Maniyarasu S.,Reed B.P.,Cant D.J.H.,Ahumada-Lazo R.,Thomas A.G.,Muryn C.A.,Maschek M.,Eriksson S.K.,Wiell T.,Lee T.-L.,Tougaard S.,Shard A.G.,Flavell W.R.

Funder

Engineering and Physical Sciences Research Council

Diamond Light Source

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference42 articles.

1. J. Woicik, ed., Hard X-ray Photoelectron Spectroscopy (HAXPES), Springer International Publishing, Cham, 2016. 10.1007/978-3-319-24043-5.

2. Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic properties;Panaccione;Surf. Sci.,2012

3. Simple universal curve for the energy-dependent electron attenuation length for all materials;Seah;Surf. Interface Anal.,2012

4. A. Jablonski, C.J. Powell, Evaluation of correction parameters for elastic-scattering effects in x-ray photoelectron spectroscopy and Auger electron spectroscopy, J. Vac. Sci. Technol. A Vacuum, Surfaces, Film. 15 (1997) 2095–2106. 10.1116/1.580615.

5. Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range;Tanuma;Surf. Interface Anal.,2011

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