Integration of epitaxial La2/3Sr1/3MnO3 thin films on silicon-on-sapphire substrate for MEMS applications-Reference-Cited by-同舟云学术

Integration of epitaxial La2/3Sr1/3MnO3 thin films on silicon-on-sapphire substrate for MEMS applications

Published:2022-03 Issue: Volume:579 Page:152095
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Chaluvadi Sandeep Kumar,Wang Zhe,Carvalho de Araújo Laryssa M.,Orgiani Pasquale,Polewczyk Vincent,Vinai Giovanni,Rousseau Olivier,Pierron Victor,Pautrat Alain,Domengès Bernadette,Schlom Darrell G.,Méchin Laurence

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference39 articles.

1. Colossal magnetoresistive manganites;Tokura;J. Magn. Magn. Mater.,1999

2. Oxide spintronics;Bibes;IEEE Trans. Electron Devices.,2007

3. Sub-nT resolution of Single Layer Sensor Based on the AMR Effect in La2/3Sr1/3MnO3 Thin Films;Enger;IEEE Trans. Magn.,2021

4. Electro-thermal and optical characterization of an uncooled suspended bolometer based on an epitaxial La0.7Sr0.3MnO3 film grown on CaTiO3/Si;Nascimento;J. Phys. D Appl. Phys.,2021

5. Epitaxial manganite freestanding bridges for low power pressure sensors;Le Bourdais;J. Appl. Phys.,2015

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure and magnetic properties of epitaxial Sr-LaMnO3 thin films obtained by polymer assisted deposition;2024-08-08

2. An improved method for measuring epi-wafer thickness based on the infrared interference principle: Addressing interference quality and multiple interferences in double-layer structures;Results in Physics;2023-11

3. Epitaxial conducting ABO3 perovskite oxide thin films;Journal of Applied Physics;2023-06-22

4. Electrolyte Gated Synaptic Transistor based on an Ultra‐Thin Film of La_0.7Sr_0.3MnO₃;Advanced Electronic Materials;2023-04-28

5. An Improved Method for Measuring Epi-Wafer Thickness Based on the Infrared Interference Principle Addressing Interference Quality and Multiple Interference in Double-Layer Structures;2023