QSA influences on isotopic ratio measurements-Reference-Cited by-同舟云学术

QSA influences on isotopic ratio measurements

Published:2004-06 Issue: Volume:231-232 Page:874-877
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Slodzian G.,Hillion F.,Stadermann F.J.,Zinner E.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference3 articles.

1. G. Slodzian, B. Daigne, F. Girard, F. Hillion, A high resolution scanning ion microscope with parallel detection of secondary ions, in: Proceedings of the Eighth SIMS Conference, Amsterdam, 1991.

2. F. Hillion, B. Daigne, F. Girard, G. Slodzian, A new high performance instrument: the Cameca Nanosims 50, in: Proceedings of the Ninth SIMS Conference, Yokohama, November 1993.

3. Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions;Slodzian;EPJ Appl. Phys.,2001

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