1. G. Slodzian, B. Daigne, F. Girard, F. Hillion, A high resolution scanning ion microscope with parallel detection of secondary ions, in: Proceedings of the Eighth SIMS Conference, Amsterdam, 1991.
2. F. Hillion, B. Daigne, F. Girard, G. Slodzian, A new high performance instrument: the Cameca Nanosims 50, in: Proceedings of the Ninth SIMS Conference, Yokohama, November 1993.
3. Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions;Slodzian;EPJ Appl. Phys.,2001