4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy

Author:

Vittone EttoreORCID,Olivero Paolo,Jakšic̈ MilkoORCID,Pastuović Željko

Funder

Ministero dell’Istruzione, dell’Università e della Ricerca

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference39 articles.

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