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Cross sections of X-ray production induced on Ti, Fe, Zn, Nb and Ta by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV

  • Published:2017-11 Issue: Volume:410 Page:102-107
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Prieto José Emilio,Galán Patricia,Zucchiatti Alessandro

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference26 articles.

1. Development of low-vacuum SIMS instruments with large cluster Ion beam;Suzuki;Surf. Interface Anal.,2016

2. Highly sensitive molecular detection with swift heavy ions;Wakamatsu;Nucl. Instrum. Methods B,2011

3. Development of mass spectrometry by high energy focused heavy ion beam: MeV SIMS with 8MeV Cl7+ beam;Jeromel;Nucl. Instrum. Methods B,2014

4. Molecular imaging of cannabis leaf tissue with MeV-SIMS method;Juncia;Nucl. Instrum. Methods B,2016

5. IAEA coordinated research project (CRP) #F11019: Development of molecular concentration mapping techniques using MeV focused ion beams.

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. K-shell X-ray production cross sections of Ti, Cr, Ni and Zn induced by chlorine ions;Applied Radiation and Isotopes;2023-09

2. L-shell X-ray production cross sections in metal oxide thin films due to 12C, 16O and 28Si ion beams at MeV SIMS energies;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-02
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