Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer-Reference-Cited by-同舟云学术

Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer

Published:2019-07 Issue: Volume:450 Page:252-256
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Wu Meiyi^ORCID,Le Guen Karine,André Jean-Michel,Jonnard Philippe,Vickridge Ian,Schmaus Didier,Briand Emrick,Walter Philippe,Huang Qiushi,Wang Zhanshan

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

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3. Lignes de Kossel observées avec des multicouches périodiques Fe/C;Chauvineau;J. Phys. IV,1996

4. Direct observation of anomalous Kossel lines;Chuev;JETP Lett.,2010

5. Standing waves and Kossel line patterns in structure determination;Marchesini;Solid State Commun.,1998

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-08

2. Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer;Review of Scientific Instruments;2018-09