Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

Author:

Balakrishnan Narayanaswamy,Jaenada MaríaORCID,Pardo Leandro

Funder

España Ministerio de Ciencia Innovación y Universidades

Natural Sciences and Engineering Research Council of Canada

Publisher

Elsevier BV

Subject

Applied Mathematics,Computational Mathematics

Reference22 articles.

1. Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes;Balakrishnan;Qual. Reliab. Eng. Int.,2022

2. Accelerated Life Testing of One-Shot Devices: Data Collection and Analysis;Balakrishnan,2021

3. On one physical principle in reliability theory (in Russian);Sedyakin;Technol. Cybern.,1966

4. Testing hypothesis of the linear accumulation of damages;Bagdonavicius;Probab. Theory Appl.,1978

5. Accelerated Testing: Statistical Models Test Plans and Data Analyses;Nelson,1990

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