A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy-Reference-Cited by-同舟云学术

A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

Published:2006-11 Issue:11 Volume:179 Page:3330-3337
ISSN:0022-4596
Container-title:Journal of Solid State Chemistry
language:en
Short-container-title:Journal of Solid State Chemistry

Author:

Behrens Malte,Tomforde Jan,May Enno,Kiebach Ragnar,Bensch Wolfgang,Häußler Dietrich,Jäger Wolfgang

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Physical and Theoretical Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Control of Reaction Pathway and the Nanostructure of Final Products through the Design of Modulated Elemental Reactants

2. Controlled synthesis of new compounds using modulated elemental reactants

3. Controlling solid-state reaction mechanisms using diffusion length in ultrathin-film superlattice composites

4. ‘‘Critical thickness’’ of amorphous phase formation in binary diffusion couples

5. Use of Superlattice Structure To Control Reaction Mechanism: Kinetics and Energetics of Nb5Se4 Formation

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