The analysis of a four-state system-Reference-Cited by-同舟云学术

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The analysis of a four-state system

Published:1976-01 Issue:1 Volume:15 Page:53-55
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Proctor C.L.,Singh B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Probabilistic Reliability: An Engineering Approach;Shooman,1968

2. Mathematical Methods of Reliability Theory;Gredenco,1969

3. The analysis of the reliability of multi-state device networks;Singh,1975

4. A three-state system Markov model;proctor;Microelectron. & Reliab.,1976

5. Reliability Optimization of Coherent System Models with Three-State Devices;Proctor,1975

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Multistate System under an Inspection and Repair Policy;IEEE Transactions on Reliability;1986

2. A Multistate System with General Repair Time Distribution;IEEE Transactions on Reliability;1980-12

3. Multi-state homogeneous Markov models in reliability analysis;Microelectronics Reliability;1980-01

4. Analysis of a degraded multistate system with general repair-time distributions;Microelectronics Reliability;1980-01

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