Effect of thickness on secondary recrystallization of Fe-3%Si-Reference-Cited by-同舟云学术

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Effect of thickness on secondary recrystallization of Fe-3%Si

Published:1994-02 Issue:2 Volume:42 Page:539-547
ISSN:0956-7151
Container-title:Acta Metallurgica et Materialia
language:en
Short-container-title:Acta Metallurgica et Materialia

Author:

Nakashima S.,Takashima K.,Harase J.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. N. P. Goss, U.S. Patent 1,965,559 (1934).

2. Structures and Magnetic Properties of Grain‐Oriented 3.2% Silicon—Iron

3. S. Taguchi, A. Sakakura and H. Takashima, Japanese Patent No. 15644/65 (1965).

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