Rapid and localized ion-beam etching of surfaces using initial notches-Reference-Cited by-同舟云学术

Rapid and localized ion-beam etching of surfaces using initial notches

Published:2018-04 Issue: Volume:107 Page:35-42
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Busch Richard,Krause Michael,Coyle Steve,Höche Thomas

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference16 articles.

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3. TEM sample preparation by ion milling/amorphization;Barna;Micron,1999

4. The physics and applications of ion beam erosion;Carter;J. Phys. D: Appl. Phys.,2001

5. Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing;Chen;Micron,2002

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2. Advanced Large Area Sample Preparation for Electron Microscopy using Initial Notches;Microscopy and Microanalysis;2022-08-01

3. Evolution of a notched surface under glancing-angle broad ion beam erosion;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-12

4. Sample preparation for analytical scanning electron microscopy using initial notch sectioning;Micron;2021-11