Impact of carbon and platinum protective layers on EDS accuracy in FIB cross-sectional analysis of W/Hf/W thin-film multilayers
Author:
Funder
Ministerstwo Nauki i Szkolnictwa Wyzszego
Publisher
Elsevier BV
Reference69 articles.
1. Focused ion beam engineering of carbon nanotubes for optical rectenna applications;Abbas;ACS Appl. Nano Mater.,2022
2. Preparation of TEM samples of metal-oxide interface by the focused ion beam technique;Abolhassani;J. Microsc.,2006
3. Preparation of multicomponent thin films by magnetron co-sputtering method: The Cu-Ti case study;Adamiak;Vacuum,2019
4. Effect of protective layer deposition in cross-sectional analysis of focused ion beam in germanium substrate;Aid;IOP Conf. Ser.: Mater. Sci. Eng.,2021
5. Implementation of focused ion beam (FIB) system in characterization of nuclear fuels and materials;Aitkaliyeva;Micron,2014
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