1. An image correction method for vibrated scan of SEM (scanning electron microscope);Homma,1987
2. Isabell, T.C., 2004, Analytical Instrumentation Facility Requirements for Nanotechnology. http://www.nanobuildings.com.
3. Measurement of magnetic field of magnetic recording head by a scanning electron microscope;Ishiba;Jpn. J. Appl. Phys.,1974
4. Peng, K.C.E., Pradeep, Y.E., Phock, C.T., 2004. Image Compensation Device for a Scanning Electron Microscope. US Patent No. US6791083B2.
5. Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methods;Płuska;J. Microsc.,2006