Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction
Author:
Funder
EPSRC
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference35 articles.
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2. FIB-based technique for stress characterization on thin films for reliability purposes;Sabate;Microelectronic Engineering,2007
3. Crystal rotation in Cu single crystal micropillars: in situ Laue and electron backscatter diffraction;Maass;Applied Physics Letters,2008
4. Experimental characterization of the mesoscale dislocation density tensor;Larson;Philosophical Magazine,2007
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