Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters-Reference-Cited by-同舟云学术

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Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emitters

Published:2011-05 Issue:6 Volume:111 Page:397-404
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Moy Charles K.S.,Ranzi Gianluca,Petersen Timothy C.,Ringer Simon P.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference57 articles.

1. Atom Probe Field Ion Microscopy;Miller,1996

2. Atom-Probe Field Ion Microscopy: Field Ion emission and surfaces and interfaces at atomic resolution;Tsong,1990

3. Field emission and field ionization;Gomer,1961

4. The crystallographic distribution of field-desorbed species;Panitz;Journal of vacuum science and technology,1974

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