Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique-Reference-Cited by-同舟云学术

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Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Published:2008-04 Issue:5 Volume:108 Page:393-398
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Warot-Fonrose B.,Houdellier F.,Hÿtch M.J.,Calmels L.,Serin V.,Snoeck E.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Electron Microdiffraction;Spence,1992

2. Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration

3. Direct observation of d-orbital holes and Cu–Cu bonding in Cu2O

4. Structure factor determination in non-centrosymmetric crystals by a two-dimensional CBED-based multi-parameter refinement method

5. A new approach to study bonding anisotropy with EELS

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