Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM-Reference-Cited by-同舟云学术

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Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM

Published:2023-11 Issue: Volume:253 Page:113821
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Heimes Damien^ORCID,Chejarla Varun Shankar,Ahmed Shamail,Hüppe Franziska,Beyer Andreas,Volz Kerstin

Funder

Deutsche Forschungsgemeinschaft

Bundesministerium für Bildung und Forschung

Bundesministerium für Bildung und Forschung Dienststelle Berlin

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy;Haas;Ultramicroscopy,2019

2. Electron holography: phase imaging with nanometer resolution;McCartney;Annu. Rev. Mater. Res.,2007

3. Applications of electron holography;Tonomura;Rev. Mod. Phys.,1987

4. Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantation;Cooper;Ultramicroscopy,2010

5. Capacitance voltage characteristics and electron holography on cubic AlGaN/GaN heterojunctions;As;Jpn. J. Appl. Phys.,2013

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