Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction-Reference-Cited by-同舟云学术

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Published:2019-01 Issue: Volume:196 Page:74-82
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Mahr Christoph,Müller-Caspary Knut^ORCID,Ritz Robert,Simson Martin,Grieb Tim,Schowalter Marco,Krause Florian F.,Lackmann Anastasia,Soltau Heike,Wittstock Arne,Rosenauer Andreas

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Strain: A Solution for higher carrier mobility in nanoscale MOSFETs;Chu;Annu. Rev. Mater. Res.,2009

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