Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction-Reference-Cited by-同舟云学术

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Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Published:2002-05 Issue:1 Volume:303 Page:179-184
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Petrik P.,Khánh N.Q.,Horváth Z.E.,Zolnai Z.,Bársony I.,Lohner T.,Fried M.,Gyulai J.,Schmidt C.,Schneider C.,Ryssel H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. (Ba,Sr)TiO3 dielectrics for future stacked- capacitor DRAM

2. Structural and optical properties of Sr1−xBaxTiO3 thin films prepared by rf sputtering

3. Crystal structure and dielectric property of epitaxially grown (Ba, Sr)TiO3 thin film prepared by molecular chemical vapor deposition

4. Ba0.7Sr0.3TiO3 ferroelectric film prepared with the sol-gel process and its dielectric performance in planar capacitor structure

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hard coatings for CR-39 based on Al2O3–ZrO2 3-glycidoxypropyltrimethoxysilane (GPTMS) and tetraethoxysilane (TEOS) nanocomposites;Journal of Sol-Gel Science and Technology;2016-03-15

2. Temperature dependence of the optical properties of Ba0.75Sr0.25TiO3 thin films;Thin Solid Films;2014-11

3. Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films;Optics Express;2012-02-08

4. The preparation and refractive index of BST thin films;Physica B: Condensed Matter;2008-08

5. Structure and Optical Properties of Ferroelectric PbZr0.40Ti0.60O3 Films Grown on LaNiO3−Coated Platinized Silicon Determined by Infrared Spectroscopic Ellipsometry;The Journal of Physical Chemistry C;2008-06-10

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