Molecular dynamics simulation of stable defect formation in Si via Coulomb explosion-Reference-Cited by-同舟云学术

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Molecular dynamics simulation of stable defect formation in Si via Coulomb explosion

Published:1996-09 Issue:1-4 Volume:118 Page:724-727
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Fedotov S.A.,Ishimaru M.,Hiroyama Y.,Motooka T.,Zaitsev A.M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Swift heavy ions in insulating and conducting oxides: tracks and physical properties

2. Damage creation via electronic excitations in metallic targets part II : A theoretical model

3. A.M. Zaitsev, W.R. Fahmer, V.S. Varichenko, A.A. Melnikov, S.A. Fedotov, A.V. Denisenko, B. Burchard and D. Fink, Nucl. Instr. and Meth. B, submitted.

4. Effects induced by high electronic excitations in pure metals: A detailed study in iron

5. Ion Explosion Spike Mechanism for Formation of Charged‐Particle Tracks in Solids

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Molecular dynamics simulations of Coulomb explosion;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-08

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