Analytical electron microscopy of grain boundary segregation: Application to Al-Zn-Mg-Cu (7xxx) alloys
Author:
Funder
EPSRC
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference22 articles.
1. Grain boundary segregation;Seah;J. Phys. F: Met. Phys.,1980
2. Analytical electron microscopy of thin segregated layers;Faulkner;X-Ray Spectrom.,1994
3. Low-magnification quantitative X-ray mapping of grain-boundary segregation in aluminum-4 wt.% copper by analytical electron microscopy;Carpenter;Microsc. Microanal.,1999
4. Electron microscopy and analysis;Goodhew,2014
5. Crack propagation during sustained-load cracking of Al-Zn-Mg-Cu aluminum alloys exposed to moist air or distilled water;Holroyd;Metall. Mater. Trans. A,2011
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