Electron optics and electron microscopy: Conference proceedings and abstracts as source material-Reference-Cited by-同舟云学术

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Electron optics and electron microscopy: Conference proceedings and abstracts as source material

Published:2003 Issue: Volume: Page:207-379
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
Short-container-title:

Author:

Hawkes P.W.

Publisher

Elsevier

Reference421 articles.

1. Sonderheft, “Übermikroskop”;AEG,1940

2. Half a century of electron microscopy: the early years;Afzelius;Ultrastruct. Pathol.,1981

3. Highlights of the IFSEM congresses, biology;Afzelius,1996

4. Electron microscopy in the United Kingdom-the AEI contribution;Agar;Micron Microsc. Acta,1986

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time‐of‐flight mass spectrometers based on a wedge‐shaped electrostatic mirror with a two‐dimensional field;Rapid Communications in Mass Spectrometry;2020-01-15

2. The correction of electron lens aberrations;Ultramicroscopy;2015-09

3. Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrors;Ultramicroscopy;2012-08

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