Impact of the interfaces in the charge trap layer on the storage characteristics of ZrO2/Al2O3 nanolaminate-based charge trap flash memory cells-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Impact of the interfaces in the charge trap layer on the storage characteristics of ZrO2/Al2O3 nanolaminate-based charge trap flash memory cells

Published:2013-02 Issue: Volume:92 Page:21-24
ISSN:0167-577X
Container-title:Materials Letters
language:en
Short-container-title:Materials Letters

Author:

Tang Zhenjie,Zhu Xinhua,Xu Hanni,Xia Yidong,Yin Jiang,Liu Zhiguo,Li Aidong,Yan Feng

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference9 articles.

1. Highly scalable non-volatile and ultra-lowpower phase-change nanowire memory;Lee;Nat Nanotechnol,2007

2. Fast and long retention-time nano-crystal memory;Hanafi;IEEE Trans Electron Devices,1996

3. Spatial distribution of charge traps in a SONOS-type flash memory using a high-k trapping layer;Zhang;IEEE Trans Electron Devices,2007

4. Charge trapping memory characteristics of p-Si/ultrathin Al2O3/(HfO2)0.8(Al2O3)0.2/Al2O3/metal multilayer structure;Tang;Electrochem Solid State Lett,2011

5. Effect of postdeposition annealing on the structural and electrical characteristics of Yb2TiO5 charge trapping layers;Pan;Appl Phys Lett,2010

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Organic heterojunction synaptic device with ultra high recognition rate for neuromorphic computing;Nano Research;2024-03-14

2. Composition dependent charge retention in amorphous HfxAl1−xOy dielectric layers;Journal of Applied Physics;2023-04-26

3. Process temperature-dependent interface quality and Maxwell–Wagner interfacial polarization in atomic layer deposited Al₂O₃/TiO₂ nanolaminates for energy storage applications;Nanoscale;2023

4. Charge Trapping in Amorphous Dielectrics for Secure Charge Storage;ACS Applied Materials & Interfaces;2021-02-23

5. The effect of inserted SiO2 thickness on memory characteristics for nonvolatile memory with stacked trapping layer;Japanese Journal of Applied Physics;2020-05-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3