Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference14 articles.
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5. Atomic scale analysis of phase formation and diffusion kinetics in Ag/Al multilayer thin films;Aboulfadl;J. Appl. Phys.,2016
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