Author:
Wilcock J.D.,Campbell D.S.,Anderson J.C.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference35 articles.
1. Stress in thin films;Wilcock,1967
2. A sensitive bending beam apparatus for measuring the stress in evaporated thin films
3. Trans. 8th Natl. Vac. Symp.;Blackburn,1961
Cited by
47 articles.
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