Author:
Woollam John A.,McGaham W.A.,Johs B.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. The accurate determination of optical properties by ellipsometry;Aspnes,1985
2. Variable angle spectroscopic ellipsometry: a non-destructive characterization technique for ultrathin and multilayer materials;Woollam;Thin Solid Films,1988
3. Variable angle spectroscopic ellipsometry;Woollam,1992
4. Ellipsometry and Polarized Light;Azzam,1977
Cited by
60 articles.
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