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Dynamic studies of defect mobility using high voltage electron microscopy

  • Published:1978-02 Issue: Volume:69-70 Page:277-309
  • ISSN:0022-3115
  • Container-title:Journal of Nuclear Materials
  • language:en
  • Short-container-title:Journal of Nuclear Materials

Author:

Kiritani Michio,Takata Hiroshi

Publisher

Elsevier BV

Subject

Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics

Reference24 articles.

1. Electron displacement damage in copper and aluminium in a high voltage electron microscope

2. Int. Congr. High Voltage Electron Microscopy;Urban,1975

3. Int. Conf. Fundamental Aspects of Radiation Damage in Metals;Urban,1975

4. Int. Conf. Fundamental Aspects of Radiation Damage in Metals;Kiritani,1975

5. Int. Conf. Fundamental Aspects of Radiation Damage in Metals;Kiritani,1975

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5. A Systematic First-Principles Study of Computational Parameters Affecting Self-diffusion Coefficients in FCC Ag, Cu, and Ni;Journal of Phase Equilibria and Diffusion;2022-09-12
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