A secondary ion mass spectometry study of the desorption mechanisms of F+ from a LiF surface bombarded with Ar+ and Ar2+-Reference-Cited by-同舟云学术

A secondary ion mass spectometry study of the desorption mechanisms of F+ from a LiF surface bombarded with Ar+ and Ar2+

Author:

Thompson Patrick M.,Taylor James W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference18 articles.

1. Secondary Ion Mass Spectrometry (SIMS IV);Williams,1984

2. Desorption Mass Spectrometry, Are SIMS and FAB the Same?;Colton,1985

4. Secondary Ion Mass Spectrometry (SIMS IV);Newbury,1984

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