Long-term carrier lifetime instabilities in n-type FZ- and Cz-silicon under illumination at elevated temperature-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Long-term carrier lifetime instabilities in n-type FZ- and Cz-silicon under illumination at elevated temperature

Published:2024-12 Issue: Volume:278 Page:113169
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Mehler Melanie^ORCID,Weinert Nicolas,Aßmann Nicole,Herguth Axel^ORCID,Hahn Giso^ORCID,Geml Fabian

Publisher

Elsevier BV

Reference40 articles.

1. Lifetime degradation and regeneration in multicrystalline silicon under illumination at elevated temperature;Bredemeier;AIP Adv.,2016

2. Impact of the firing temperature profile on light induced degradation of multicrystalline silicon;Eberle;Phys. Status Solidi RRL,2016

3. Firing and gettering dependence of effective defect density in material exhibiting LeTID;Skorka;AIP Conf. Proc.,2018

4. LeTID mitigation via an adapted firing process in p-type PERC cells from SMART cast-monocrystalline, Czochralski and high-performance multicrystalline silicon;Maischner;Prog. Photovolt. Res. Appl.,2021

5. A new light induced volume degradation effect of mc-Si solar cells and modules;Kersten,2015

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP