Morphological stability of electrostrictive thin films-Reference-Cited by-同舟云学术

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Morphological stability of electrostrictive thin films

Published:2024-06 Issue: Volume:199 Page:104073
ISSN:0020-7225
Container-title:International Journal of Engineering Science
language:en
Short-container-title:International Journal of Engineering Science

Author:

Zhang Jin^ORCID,Voorhees Peter W.

Funder

Office of Naval Research

Publisher

Elsevier BV

Reference23 articles.

1. Transport processes during the growth of oxide films at elevated temperature;Atkinson;Reviews of Modern Physics,1985

2. Theory of the oxidation of metals;Cabrera;Reports on Progress in Physics,1949

3. Nonlinear electroelasticity;Dorfmann;Acta Mechanica,2005

4. Electrostatic field-induced surface instability;Du;Applied Physics Letters,2004

5. Morphological instability leading to formation of porous anodic oxide films;Hebert;Nature Materials,2012

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