Fault Tolerance in Carbon Nanotube Transistors Based Multi Valued Logic-Reference-Cited by-同舟云学术

Fault Tolerance in Carbon Nanotube Transistors Based Multi Valued Logic

Published:2021-10-13 Issue: Volume: Page:
ISSN:
Container-title:Carbon Nanotubes - Redefining the World of Electronics
language:
Short-container-title:

Author:

Sundararajan Gopalakrishnan

Abstract

This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method for error correction called Restorative Feedback (RFB). The RFB method is a variant of Triple-Modular Redundancy (TMR) that utilizes the fault masking capabilities of the Muller C element to provide added protection against noisy transient faults. Fault tolerant properties of Muller C element is discussed and error correction capability of RFB method is demonstrated in detail.

Publisher

IntechOpen

Link

http://www.intechopen.com/download/pdf/74683

Reference30 articles.

1. J. Appenzeller, J. Knoch, R. Martel, V. Derycke, S.J. Wind, and P. Avouris, “Carbon nanotube electronics,” Nanotechnology, IEEE Transactions on, vol. 1, no. 4, pp. 184–189, dec 2002.

2. K.K. Likharev, “Single-electron devices and their applications,” Proceedings of the IEEE, vol. 87, no. 4, pp. 606–632, apr 1999.

3. S. Onneweer, H. Kerkhoff, and J. Butler, “Structural computer-aided design of current-mode CMOS logic circuits,” in Multiple-Valued Logic, 1988., Proceedings of the Eighteenth International Symposium on, 0–0 1988, pp. 21–30.

4. Y. Chang and J.T. Butler, “The design of current mode CMOS multiple-valued circuits,” in Multiple-Valued Logic, 1991., Proceedings of the Twenty-First International Symposium on, may 1991, pp. 130–138.

5. Weste Neil H. E. and David Harris, CMOS VLSI Design: A circuit and systems perspective, Pearson, 3/e edition, 2006.