Comparative study of structural and stoichiometric properties of titanium nitride films deposited by cathodic cage plasma deposition and magnetron sputtering
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy,Fluid Flow and Transfer Processes
Link
https://link.springer.com/content/pdf/10.1140/epjp/s13360-022-02543-8.pdf
Reference46 articles.
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2. P. Balashabadi et al., The effect of bias voltage on microstructure and hardness of TiN films grown by ion coating deposition. Eur. Phys. J. Plus 130(2), 1–10 (2015)
3. K. Smagoń et al., Studies of the micromorphology of sputtered TiN thin films by autocorrelation techniques. The Eur. Phys. J. Plus 132(12), 1–15 (2017)
4. L.H.P. Abreu et al., Synthesis of TiN and TiO 2 thin films by cathodic cage plasma deposition: a brief review. J. Braz. Soc. Mech. Sci. Eng. 42(9), 1–13 (2020)
5. L. Romero et al., Titanium dioxide thin films deposited by electric field-assisted CVD: effect on antimicrobial and photocatalytic properties. Chem. Vapor Deposit. 21, 63–70 (2015)
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