1. R. J. Schoelkopf, A. A. Kozhevnikov, D. E. Prober, Departments of Applied Physics and Physics, Yale University, New Haven, CT 06520–8284, USA.
2. P. Wahlgren and P. Delsing, Department of Microelectronics and Nanoscience, Chalmers University of Technology and Göteborg University, S-412 96 Göteborg, Sweden.