Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
Author:
Affiliation:
1. Park Scientific Instruments, 1171 Borregas Avenue, Sunnyvale, CA 94089, USA.
Publisher
American Association for the Advancement of Science (AAAS)
Subject
Multidisciplinary
Reference15 articles.
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2. BINNIG, G, 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE, PHYSICAL REVIEW LETTERS 50: 120 (1983).
3. BINNIG, G, ATOMIC FORCE MICROSCOPE, PHYSICAL REVIEW LETTERS 56: 930 (1986).
4. DURIG, U, MAPPING OF SHORT-RANGE ADHESIVE FORCES BY SCANNING-TUNNELING-MICROSCOPY, PHYSICAL REVIEW B 50: 5008 (1994).
5. DURIG, U, OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE, PHYSICAL REVIEW LETTERS 65: 349 (1990).
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