Correlation between the local stress and the grain misorientation in the polycrystalline Al2O3 measured by near-field luminescence spectroscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/57/i=6S1/a=06HF01/pdf
Reference31 articles.
1. Stress relaxation in Si-doped GaN studied by Raman spectroscopy
2. Residual stress measurement in thin carbon films by Raman spectroscopy and nanoindentation
3. Grain orientation, texture, and internal stress optically evaluated by micro-Raman spectroscopy
4. Effect of Stress on the Trigonal Splittings ofd3Ions in Sapphire (α-Al2O3)
5. Pressure Measurement Made by the Utilization of Ruby Sharp-Line Luminescence
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scanning Tunneling Measurements in Membrane-Based Nanostructures: Spatially-Resolved Quantum State Analysis in Postprocessed Epitaxial Systems for Optoelectronic Applications;ACS Applied Nano Materials;2019-06-24
2. Asymmetric Line Shape of Near-field Luminescence Spectrum Induced by Stress in Al2O3;Sensors and Materials;2018-12-18
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