Interdiffusion Mechanism and Thermal Conductance at the Interfaces in Low-Temperature Cu-to-Cu Bonds Achieved by Coating Nanolayers

Author:

Jiang Xiaofan,Tao Zeming,Li Yuan,Sun Fangyuan,Yu Daquan,Zhong Yi

Publisher

Elsevier BV

Reference34 articles.

1. A Critical Review of Thermal Boundary Conductance across Wide and Ultrawide Bandgap Semiconductor Interfaces;T Feng;J. ACS Appl. Mater. Inter,2023

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