Using data mining and root cause analysis method for failure analysis in electronic components

Abstract

Abstract The electronic components are the core of all electronic products, the reliability and maintainability directly affect manufacture products quality. And as products become more complex and more demanding. We need more reliable components. In order to solve this problem, we need to analysis how and why those components failed. Failure analysis cases are important data for analysis, data mining and improving reliability. China Electronic Product Reliability and Environment Testing Research Institute (CEPREI) is the earliest research organization engaged in reliability research and failure analysis in China, and has accumulated rich failure case data. By combining data mining methods such as Bayesian network, correlation analysis, we can perform statistical analysis and root cause analysis to assist failure analysis and improve product reliability. This paper will apply the failure analysis case of the electromagnetic relay, and explores and analyses related regular pattern.