Development the Fourier analysis method of x-ray diffraction to calculate variables in crystal structure as well as calculation of some lattice parameters

Author:

Jahil Sarab Saadi,Harbbi Khalid Hellal

Abstract

Abstract The Fourier method was developed to calculate other important variables in the crystalline structure, such a strain, which is equal to 7.4828 x 10−3 instead of the mean square strain and the energy density of the strain, which is equal to 2799614.7 dyne / cm2 and the stress equal to 7.4828 x 108 dyne/cm2. The results obtained from the Fourier method for calculating other parameters of the manganese oxide lattice for each peak of x-ray diffraction peaks such as the texture coefficient, its mean value equal to 0.99999 and the micro strains, which its mean value equal to 4.47 × 10−3 dislocation density, its mean value are equal to 37.3 (lines .m−2) and the specific surface area its mean value is equal to 19,58432 of crystalline volume. A comparison was also made between the values of the square of strain and the apparent strain.

Publisher

IOP Publishing

Subject

General Medicine

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