Development the Fourier analysis method of x-ray diffraction to calculate variables in crystal structure as well as calculation of some lattice parameters

Abstract

Abstract The Fourier method was developed to calculate other important variables in the crystalline structure, such a strain, which is equal to 7.4828 x 10−3 instead of the mean square strain and the energy density of the strain, which is equal to 2799614.7 dyne / cm2 and the stress equal to 7.4828 x 108 dyne/cm2. The results obtained from the Fourier method for calculating other parameters of the manganese oxide lattice for each peak of x-ray diffraction peaks such as the texture coefficient, its mean value equal to 0.99999 and the micro strains, which its mean value equal to 4.47 × 10−3 dislocation density, its mean value are equal to 37.3 (lines .m−2) and the specific surface area its mean value is equal to 19,58432 of crystalline volume. A comparison was also made between the values of the square of strain and the apparent strain.