Measuring the dielectric properties of materials. Ninety-year development from low-frequency techniques to broadband spectroscopy and high-frequency imaging-Reference-Cited by-同舟云学术

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Measuring the dielectric properties of materials. Ninety-year development from low-frequency techniques to broadband spectroscopy and high-frequency imaging

Published:2012-12-03 Issue:1 Volume:24 Page:012005
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Kaatze U

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/24/i=1/a=012005/pdf

Reference475 articles.

1. Electromagnetic Properties of Multiphase Dielectrics

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