Recent developments in dimensional nanometrology using AFMs
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference165 articles.
1. Two-dimensional encoder with picometre resolution using lattice spacing on regular crystalline surface as standard
2. Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy
3. Self-sensing and self-actuating probe based on quartz tuning fork combined with microfabricated cantilever for dynamic mode atomic force microscopy
4. Determination of the Avogadro Constant by Counting the Atoms in aSi28Crystal
5. Microfabricated diamond tip for nanoprobing
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