Spectroscopy of highly charged ions and its relevance to EUV and soft x-ray source development-Reference-Cited by-同舟云学术

Spectroscopy of highly charged ions and its relevance to EUV and soft x-ray source development

Published:2015-05-28 Issue:14 Volume:48 Page:144025
ISSN:0953-4075
Container-title:Journal of Physics B: Atomic, Molecular and Optical Physics
language:
Short-container-title:J. Phys. B: At. Mol. Opt. Phys.

Author:

O’Sullivan Gerry,Li Bowen,D’Arcy Rebekah,Dunne Padraig,Hayden Paddy,Kilbane Deirdre,McCormack Tom,Ohashi Hayato,O’Reilly Fergal,Sheridan Paul,Sokell Emma,Suzuki Chihiro,Higashiguchi Takeshi

Funder

Science Foundation Ireland

Publisher

IOP Publishing

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://stacks.iop.org/0953-4075/48/i=14/a=144025/pdf

Reference95 articles.

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