Scanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA molecules-Reference-Cited by-同舟云学术

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Scanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA molecules

Published:2002-05-24 Issue:3 Volume:13 Page:314-317
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Gómez-Navarro C,Gil A,Álvarez M,Pablo P J De,Moreno-Herrero F,Horcas I,Fernández-Sánchez R,Colchero J,Gómez-Herrero J,Baró A M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/13/i=3/a=315/pdf

Reference17 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Atomic Force Microscope

3. Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space

4. Jumping mode scanning force microscopy

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