THE ELECTROMECHANICAL PROPERTIES OF HIGHLY [100] ORIENTED [Pb(Zr0.52Ti0.48)O3, PZT] THIN FILMS-Reference-Cited by-同舟云学术

THE ELECTROMECHANICAL PROPERTIES OF HIGHLY [100] ORIENTED [Pb(Zr0.52Ti0.48)O3, PZT] THIN FILMS

Published:2006-11 Issue:1 Volume:80 Page:77-85
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

MARSHALL J. M.¹,CORKOVIC S.¹,ZHANG Q.¹,WHATMORE R. W.¹,CHIMA-OKEREKE C.²,ROBERTS W. L.²,BUSHBY A. J.²,REECE M. J.²

Affiliation:

1. a Department of Advanced Materials , SIMS, Cranfield University , Beds, MK43 0AL, UK

2. b Department of Materials , Queen Mary, University London, Mile End Road , London, E1 4NS, United Kingdom

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580600656437

Reference14 articles.

1. Ferroelectrics, microsystems and nanotechnology

2. http://www.ifi.uio.no/∼sverre/nice.html

3. Thin-film bulk acoustic resonators and filters using ZnO and lead-zirconium-titanate thin films

4. {1 0 0}-Textured, piezoelectric Pb(Zrx, Ti1−x)O3 thin films for MEMS: integration, deposition and properties

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1. Synergistic composites energy harvester beams based on hybrid ZnO/PZT piezoelectric nanomaterials;Smart Materials and Structures;2022-12-30

2. Effects of annealing temperature and pressure of vacuum infiltration on the electrical properties of Pb(Zr0.52Ti0.48)O3 thick films prepared via a modified sol–gel method;Thin Solid Films;2020-07

3. Study of Pb(Zr 0.52 Ti 0.48 )O 3 microelectromechanical system piezoelectric accelerometers for health monitoring of mechanical motors;Journal of the American Ceramic Society;2019-01-07

4. Improved ferroelectric properties of (100)-oriented PZT thin films deposited on stainless steel substrates with La0.5Sr0.5CoO3 buffer layers;Journal of Materials Science: Materials in Electronics;2018-07-06

5. Impact of crystallisation processes on depth profile formation in sol–gel PbZr0·52Ti0·48O3thin films;Advances in Applied Ceramics;2013-01