Statistical Inference of a Time-to-Failure Distribution Derived From Linear Degradation Data-Reference-Cited by-同舟云学术

Statistical Inference of a Time-to-Failure Distribution Derived From Linear Degradation Data

Published:1997-11 Issue:4 Volume:39 Page:391-400
ISSN:0040-1706
Container-title:Technometrics
language:en
Short-container-title:Technometrics

Author:

Lu Jye-Chyi,Park Jinho,Yang Qing

Publisher

Informa UK Limited

Subject

Applied Mathematics,Modeling and Simulation,Statistics and Probability

Link

http://www.tandfonline.com/doi/pdf/10.1080/00401706.1997.10485158

Reference36 articles.

1. Bernstein reliability model: Derivation and estimation of parameters

2. Experimental Design for a Class of Accelerated Degradation Tests

3. Carey, M. B. and Tortorella, M. “Analysis of Degradation Data Applied to MOS Devices,”. paper presented at the 6th International Conference on Reliability and Maintainability. Strasbourg, France.

4. Reliability effects on MOS transistors due to hot-carrier injection

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