C2DEM-YOLO: improved YOLOv8 for defect detection of photovoltaic cell modules in electroluminescence image-Reference-Cited by-同舟云学术

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C2DEM-YOLO: improved YOLOv8 for defect detection of photovoltaic cell modules in electroluminescence image

Published:2024-02-28 Issue: Volume: Page:1-23
ISSN:1058-9759
Container-title:Nondestructive Testing and Evaluation
language:en
Short-container-title:Nondestructive Testing and Evaluation

Author:

Zhu Jiahao¹²,Zhou Deqiang¹²,Lu Rongsheng³,Liu Xu⁴,Wan Dahang³⁴

Affiliation:

1. School of Mechanical Engineering, Jiangnan University, Wuxi, China

2. Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Wuxi, China

3. School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China

4. Wedo Machine Vision Industry Technology Research Institute Co. Ltd

Funder

project funding from Wuxi Municipal Bureau of Science and Technology

太湖之光”科技攻关(产业前瞻及关键技术研发

Light of Taihu Lake

Industrial Prospect and Key Technology Research

Publisher

Informa UK Limited

Link

https://www.tandfonline.com/doi/pdf/10.1080/10589759.2024.2319263

Reference40 articles.

1. Status and perspectives of crystalline silicon photovoltaics in research and industry

2. Eddy current O-scan and C-scan imaging techniques for macrocrack detection in silicon solar cells

3. Effect of surface texturization on minority carrier lifetime and photovoltaic performance of monocrystalline silicon solar cell

4. Nondestructive inspection, testing and evaluation for Si-based, thin film and multi-junction solar cells: An overview

5. A Novel Multispectral Fusion Defect Detection Framework With Coarse-to-Fine Multispectral Registration

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1. Multiclass small target detection algorithm for surface defects of chemicals special steel;Frontiers in Physics;2024-08-30

2. DFW-YOLO: YOLOv5-based algorithm using phased array ultrasonic testing for weld defect recognition;Nondestructive Testing and Evaluation;2024-07-27

3. An industrial product surface anomaly detection method based on masked image modeling;Nondestructive Testing and Evaluation;2024-05-24

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