Atomic force microscopy of anodized zirconium substrates
Author:
Affiliation:
1. a Corrosion and Protection Centre, UMIST , P.O. Box 88 , Manchester , M60 1QD , England
2. b Department of Chemistry, Faculty of Science and Industry , Keio University , Hiyoshi, Kohoku-ku, Yokohama , 223 , Japan
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/01418639408240190
Reference3 articles.
1. Atomic Force Microscope
2. Ph.D. Thesis;Kurima Y.,1993
3. Electrolytic formation of insulating oxide films on zirconium—II. Electrode kinetics at constant voltage
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2. Cyclic voltammetry, x-ray photoelectron spectroscopy, secondary-ion-mass spectrometry, and ion-scattering spectrometry examination of zirconium passive film breakdown in the presence of sulfate;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2000-07
3. Nanofabrication of a quantum dot array: Atomic force microscopy of electropolished aluminum;Journal of Electronic Materials;1996-10
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